Theoretical Analysis of the Effect of dU/dt in 4H–SiC Thyristor Structures


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On the basis of numerical simulation, specificities of the effect of dU/dt in 4H–SiC thyristor structures, related to realization of the recently discovered triggering α-mechanism are analyzed. It is shown that one of the manifestations of this mechanism is a catastrophic reduction in the voltage blocked by a thyristor with an increase in temperature of the structure. Practical ways of eliminating this effect are discussed.

Sobre autores

S. Yurkov

Moscow Power Engineering Institute

Autor responsável pela correspondência
Email: yurkov.sn@mail.ru
Rússia, Moscow, 111250

T. Mnatsakanov

Moscow Power Engineering Institute

Email: yurkov.sn@mail.ru
Rússia, Moscow, 111250

A. Tandoev

Moscow Power Engineering Institute

Email: yurkov.sn@mail.ru
Rússia, Moscow, 111250

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