Theoretical Analysis of the Effect of dU/dt in 4H–SiC Thyristor Structures
- Авторлар: Yurkov S.N.1, Mnatsakanov T.T.1, Tandoev A.G.1
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Мекемелер:
- Moscow Power Engineering Institute
- Шығарылым: Том 63, № 10 (2018)
- Беттер: 1497-1503
- Бөлім: Solid State Electronics
- URL: https://bakhtiniada.ru/1063-7842/article/view/202162
- DOI: https://doi.org/10.1134/S1063784218100250
- ID: 202162
Дәйексөз келтіру
Аннотация
On the basis of numerical simulation, specificities of the effect of dU/dt in 4H–SiC thyristor structures, related to realization of the recently discovered triggering α-mechanism are analyzed. It is shown that one of the manifestations of this mechanism is a catastrophic reduction in the voltage blocked by a thyristor with an increase in temperature of the structure. Practical ways of eliminating this effect are discussed.
Негізгі сөздер
Авторлар туралы
S. Yurkov
Moscow Power Engineering Institute
Хат алмасуға жауапты Автор.
Email: yurkov.sn@mail.ru
Ресей, Moscow, 111250
T. Mnatsakanov
Moscow Power Engineering Institute
Email: yurkov.sn@mail.ru
Ресей, Moscow, 111250
A. Tandoev
Moscow Power Engineering Institute
Email: yurkov.sn@mail.ru
Ресей, Moscow, 111250
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