Quantum Yield of a Silicon XUV Avalanche Photodiode in the 320–1100 nm Wavelength Range


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Quantum photoresponse yield of a silicon XUV avalanche photodiode prototype with 1.5‑mm-diameter active region has been studied in the 320–1100 nm wavelength range. It is established that the proposed avalanche photodiode has the external quantum efficiency above 20 electron/photon in the 580–1000 nm range at a reverse bias voltage of 485 V.

作者简介

V. Zabrodskii

Ioffe Physical Technical Institute, Russian Academy of Sciences

编辑信件的主要联系方式.
Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021

P. Aruev

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021

B. Ber

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021

D. Kazantsev

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021

A. Gorokhov

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021

A. Nikolaev

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021

V. Filimonov

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021

M. Shvarts

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021

E. Sherstnev

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021

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