Quantum Yield of a Silicon XUV Avalanche Photodiode in the 320–1100 nm Wavelength Range
- 作者: Zabrodskii V.V.1, Aruev P.N.1, Ber B.Y.1, Kazantsev D.Y.1, Gorokhov A.N.1, Nikolaev A.V.1, Filimonov V.V.1, Shvarts M.Z.1, Sherstnev E.V.1
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隶属关系:
- Ioffe Physical Technical Institute, Russian Academy of Sciences
- 期: 卷 45, 编号 12 (2019)
- 页面: 1226-1229
- 栏目: Article
- URL: https://bakhtiniada.ru/1063-7850/article/view/208508
- DOI: https://doi.org/10.1134/S1063785019120289
- ID: 208508
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详细
Quantum photoresponse yield of a silicon XUV avalanche photodiode prototype with 1.5‑mm-diameter active region has been studied in the 320–1100 nm wavelength range. It is established that the proposed avalanche photodiode has the external quantum efficiency above 20 electron/photon in the 580–1000 nm range at a reverse bias voltage of 485 V.
作者简介
V. Zabrodskii
Ioffe Physical Technical Institute, Russian Academy of Sciences
编辑信件的主要联系方式.
Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
P. Aruev
Ioffe Physical Technical Institute, Russian Academy of Sciences
Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
B. Ber
Ioffe Physical Technical Institute, Russian Academy of Sciences
Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
D. Kazantsev
Ioffe Physical Technical Institute, Russian Academy of Sciences
Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
A. Gorokhov
Ioffe Physical Technical Institute, Russian Academy of Sciences
Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
A. Nikolaev
Ioffe Physical Technical Institute, Russian Academy of Sciences
Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
V. Filimonov
Ioffe Physical Technical Institute, Russian Academy of Sciences
Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
M. Shvarts
Ioffe Physical Technical Institute, Russian Academy of Sciences
Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
E. Sherstnev
Ioffe Physical Technical Institute, Russian Academy of Sciences
Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
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