Intracavity Waveguide Spectroscopy of Thin Films


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The method of intracavity waveguide spectroscopy for measuring low optical losses in thin films is proposed. The method also allows one to distinguish transverse and longitudinal modes in low-gain lasers without introducing considerable losses into the cavity.

作者简介

A. Shulga

Belarusian–Russian University

Email: avkh@mogilev.by
白俄罗斯, Mogilev, 212000

A. Khomchenko

Belarusian–Russian University

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Email: avkh@mogilev.by
白俄罗斯, Mogilev, 212000

I. Shilova

Belarusian–Russian University

Email: avkh@mogilev.by
白俄罗斯, Mogilev, 212000

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