Enviar artigo por via de e-mail Stress Relaxation in CrSi2 Crystals Grown under Microgravity Conditions from Zn Melt in the Cr–Si–Zn System
- Autores: Kalashnikov E.V.1,2, Gurin V.N.1, Nikanorov S.P.1, Yagovkina M.A.1, Derkachenko L.I.1
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Afiliações:
- Ioffe Physical Technical Institute, Russian Academy of Sciences
- Moscow State Regional University
- Edição: Volume 45, Nº 7 (2019)
- Páginas: 687-689
- Seção: Article
- URL: https://bakhtiniada.ru/1063-7850/article/view/208366
- DOI: https://doi.org/10.1134/S106378501907006X
- ID: 208366
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E. Kalashnikov
Ioffe Physical Technical Institute, Russian Academy of Sciences; Moscow State Regional University
Autor responsável pela correspondência
Email: ekevkalashnikov1@gmail.com
Rússia, St. Petersburg, 194021; Mytishchi, Moscow oblast, 141014
V. Gurin
Ioffe Physical Technical Institute, Russian Academy of Sciences
Email: ekevkalashnikov1@gmail.com
Rússia, St. Petersburg, 194021
S. Nikanorov
Ioffe Physical Technical Institute, Russian Academy of Sciences
Email: ekevkalashnikov1@gmail.com
Rússia, St. Petersburg, 194021
M. Yagovkina
Ioffe Physical Technical Institute, Russian Academy of Sciences
Email: ekevkalashnikov1@gmail.com
Rússia, St. Petersburg, 194021
L. Derkachenko
Ioffe Physical Technical Institute, Russian Academy of Sciences
Email: ekevkalashnikov1@gmail.com
Rússia, St. Petersburg, 194021
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