Stress Relaxation in CrSi2 Crystals Grown under Microgravity Conditions from Zn Melt in the Cr–Si–Zn System


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Аннотация

Experimental data obtained in a study of CrSi2 microcrystals grown under microgravity conditions from a Zn melt in the Cr–Si–Zn system by the mass crystallization method and then placed in terrestrial conditions are presented and analyzed. New properties of crystals of this kind are observed.

Авторлар туралы

E. Kalashnikov

Ioffe Physical Technical Institute, Russian Academy of Sciences; Moscow State Regional University

Хат алмасуға жауапты Автор.
Email: ekevkalashnikov1@gmail.com
Ресей, St. Petersburg, 194021; Mytishchi, Moscow oblast, 141014

V. Gurin

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: ekevkalashnikov1@gmail.com
Ресей, St. Petersburg, 194021

S. Nikanorov

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: ekevkalashnikov1@gmail.com
Ресей, St. Petersburg, 194021

M. Yagovkina

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: ekevkalashnikov1@gmail.com
Ресей, St. Petersburg, 194021

L. Derkachenko

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: ekevkalashnikov1@gmail.com
Ресей, St. Petersburg, 194021

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