Stress Relaxation in CrSi2 Crystals Grown under Microgravity Conditions from Zn Melt in the Cr–Si–Zn System


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Abstract

Experimental data obtained in a study of CrSi2 microcrystals grown under microgravity conditions from a Zn melt in the Cr–Si–Zn system by the mass crystallization method and then placed in terrestrial conditions are presented and analyzed. New properties of crystals of this kind are observed.

About the authors

E. V. Kalashnikov

Ioffe Physical Technical Institute, Russian Academy of Sciences; Moscow State Regional University

Author for correspondence.
Email: ekevkalashnikov1@gmail.com
Russian Federation, St. Petersburg, 194021; Mytishchi, Moscow oblast, 141014

V. N. Gurin

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: ekevkalashnikov1@gmail.com
Russian Federation, St. Petersburg, 194021

S. P. Nikanorov

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: ekevkalashnikov1@gmail.com
Russian Federation, St. Petersburg, 194021

M. A. Yagovkina

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: ekevkalashnikov1@gmail.com
Russian Federation, St. Petersburg, 194021

L. I. Derkachenko

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: ekevkalashnikov1@gmail.com
Russian Federation, St. Petersburg, 194021

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