The temperature dependence of the characteristics of crystalline-silicon-based heterojunction solar cells
- Авторлар: Sachenko A.V.1, Kryuchenko Y.V.1, Kostylyov V.P.1, Korkishko R.M.1, Sokolovskyi I.O.1, Abramov A.S.2, Abolmasov S.N.2, Andronikov D.A.2, Bobyl’ A.V.3, Panaiotti I.E.3, Terukov E.I.2,3, Titov A.S.3, Shvarts M.Z.3
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Мекемелер:
- Lashkaryov Institute of Semiconductor Physics
- R&D Center for Thin-Film Technologies in Energetics, Ioffe Physical Technical Institute
- Ioffe Physical Technical Institute
- Шығарылым: Том 42, № 3 (2016)
- Беттер: 313-316
- Бөлім: Article
- URL: https://bakhtiniada.ru/1063-7850/article/view/198172
- DOI: https://doi.org/10.1134/S1063785016030305
- ID: 198172
Дәйексөз келтіру
Аннотация
Temperature dependences of the photovoltaic characteristics of (p)a-Si/(i)a-Si:H/(n)c-Si singlecrystalline- silicon based heterojunction-with-intrinsic-thin-layer (HIT) solar cells have been measured in a temperature range of 80–420 K. The open-circuit voltage (VOC), fill factor (FF) of the current–voltage (I–U) characteristic, and maximum output power (Pmax) reach limiting values in the interval of 200–250 K on the background of monotonic growth in the short-circuit current (ISC) in a temperature range of 80–400 K. At temperatures below this interval, the VOC, FF, and Pmax values exhibit a decrease. It is theoretically justified that a decrease in the photovoltaic energy conversion characteristics of solar cells observed on heating from 250 to 400 K is related to exponential growth in the intrinsic conductivity. At temperatures below 200 K, the I–U curve shape exhibits a change that is accompanied by a drop in VOC. Possible factors that account for the decrease in VOC, FF, and Pmax are considered.
Негізгі сөздер
Авторлар туралы
A. Sachenko
Lashkaryov Institute of Semiconductor Physics
Хат алмасуға жауапты Автор.
Email: sach@isp.kiev.ua
Украина, Kyiv, 03028
Yu. Kryuchenko
Lashkaryov Institute of Semiconductor Physics
Email: sach@isp.kiev.ua
Украина, Kyiv, 03028
V. Kostylyov
Lashkaryov Institute of Semiconductor Physics
Email: sach@isp.kiev.ua
Украина, Kyiv, 03028
R. Korkishko
Lashkaryov Institute of Semiconductor Physics
Email: sach@isp.kiev.ua
Украина, Kyiv, 03028
I. Sokolovskyi
Lashkaryov Institute of Semiconductor Physics
Email: sach@isp.kiev.ua
Украина, Kyiv, 03028
A. Abramov
R&D Center for Thin-Film Technologies in Energetics, Ioffe Physical Technical Institute
Email: sach@isp.kiev.ua
Ресей, St. Petersburg, 194064
S. Abolmasov
R&D Center for Thin-Film Technologies in Energetics, Ioffe Physical Technical Institute
Email: sach@isp.kiev.ua
Ресей, St. Petersburg, 194064
D. Andronikov
R&D Center for Thin-Film Technologies in Energetics, Ioffe Physical Technical Institute
Email: sach@isp.kiev.ua
Ресей, St. Petersburg, 194064
A. Bobyl’
Ioffe Physical Technical Institute
Email: sach@isp.kiev.ua
Ресей, St. Petersburg, 194021
I. Panaiotti
Ioffe Physical Technical Institute
Email: sach@isp.kiev.ua
Ресей, St. Petersburg, 194021
E. Terukov
R&D Center for Thin-Film Technologies in Energetics, Ioffe Physical Technical Institute; Ioffe Physical Technical Institute
Email: sach@isp.kiev.ua
Ресей, St. Petersburg, 194064; St. Petersburg, 194021
A. Titov
Ioffe Physical Technical Institute
Email: sach@isp.kiev.ua
Ресей, St. Petersburg, 194021
M. Shvarts
Ioffe Physical Technical Institute
Email: sach@isp.kiev.ua
Ресей, St. Petersburg, 194021
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