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Photoresponse of Optical Sensors Based on Transition Metal Dichalcogenides: Influence of Thickness on Spectral Characteristics


Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

Prototype field-effect transistors based on solid solutions of transition metal dichalcogenides (TMDs) have been manufactured, and their spectral characteristics were studied using the photocurrent spectroscopy technique. Results of theoretical estimation of the total optical absorbance of two-dimensional (2D) TMD-based semiconductors of various thicknesses are presented as dependent on the light wavelength with allowance for the multiray interference. It is established that the interference effect significantly contributes to the resulting shapes of spectral characteristics of these optical sensors with variable thickness of TMD-based photosensitive layers.

Авторлар туралы

A. Avdizhiyan

Moscow Institute of Radio Engineering, Electronics, and Automation, Russian Technological University

Хат алмасуға жауапты Автор.
Email: artur-333@yandex.ru
Ресей, Moscow, 119454

S. Lavrov

Moscow Institute of Radio Engineering, Electronics, and Automation, Russian Technological University

Email: artur-333@yandex.ru
Ресей, Moscow, 119454

A. Kudryavtsev

Moscow Institute of Radio Engineering, Electronics, and Automation, Russian Technological University

Email: artur-333@yandex.ru
Ресей, Moscow, 119454

A. Shestakova

Moscow Institute of Radio Engineering, Electronics, and Automation, Russian Technological University

Email: artur-333@yandex.ru
Ресей, Moscow, 119454

M. Vasina

Moscow Institute of Radio Engineering, Electronics, and Automation, Russian Technological University

Email: artur-333@yandex.ru
Ресей, Moscow, 119454

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