Photoresponse of Optical Sensors Based on Transition Metal Dichalcogenides: Influence of Thickness on Spectral Characteristics


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Prototype field-effect transistors based on solid solutions of transition metal dichalcogenides (TMDs) have been manufactured, and their spectral characteristics were studied using the photocurrent spectroscopy technique. Results of theoretical estimation of the total optical absorbance of two-dimensional (2D) TMD-based semiconductors of various thicknesses are presented as dependent on the light wavelength with allowance for the multiray interference. It is established that the interference effect significantly contributes to the resulting shapes of spectral characteristics of these optical sensors with variable thickness of TMD-based photosensitive layers.

Sobre autores

A. Avdizhiyan

Moscow Institute of Radio Engineering, Electronics, and Automation, Russian Technological University

Autor responsável pela correspondência
Email: artur-333@yandex.ru
Rússia, Moscow, 119454

S. Lavrov

Moscow Institute of Radio Engineering, Electronics, and Automation, Russian Technological University

Email: artur-333@yandex.ru
Rússia, Moscow, 119454

A. Kudryavtsev

Moscow Institute of Radio Engineering, Electronics, and Automation, Russian Technological University

Email: artur-333@yandex.ru
Rússia, Moscow, 119454

A. Shestakova

Moscow Institute of Radio Engineering, Electronics, and Automation, Russian Technological University

Email: artur-333@yandex.ru
Rússia, Moscow, 119454

M. Vasina

Moscow Institute of Radio Engineering, Electronics, and Automation, Russian Technological University

Email: artur-333@yandex.ru
Rússia, Moscow, 119454

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