Thermal lithography of thin films of vanadium dioxide
- Авторлар: Andreev V.N.1, Klimov V.A.1, Kompan M.E.1
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Мекемелер:
- Ioffe Physical Technical Institute
- Шығарылым: Том 42, № 1 (2016)
- Беттер: 19-22
- Бөлім: Article
- URL: https://bakhtiniada.ru/1063-7850/article/view/196701
- DOI: https://doi.org/10.1134/S1063785016010028
- ID: 196701
Дәйексөз келтіру
Аннотация
A technique is proposed for making microareas with sharply different optical and electrical properties in thin films of vanadium dioxide. The technique is based on vacuum annealing of thin films, which results in a yield of oxygen from vanadium dioxide with the formation of an oxygen vacancy in it.
Негізгі сөздер
Авторлар туралы
V. Andreev
Ioffe Physical Technical Institute
Email: v.klimov@mail.ioffe.ru
Ресей, St. Petersburg, 194021
V. Klimov
Ioffe Physical Technical Institute
Хат алмасуға жауапты Автор.
Email: v.klimov@mail.ioffe.ru
Ресей, St. Petersburg, 194021
M. Kompan
Ioffe Physical Technical Institute
Email: v.klimov@mail.ioffe.ru
Ресей, St. Petersburg, 194021
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