Analysis of reliability of semiconductor emitters with different designs of cavities

A. V. Ivanov; V. D. Kurnosov; K. V. Kurnosov; Yu. V. Kurnyavko; A. V. Lobintsov; A. S. Meshkov; V. N. Penkin; V. I. Romantsevich; M. B. Uspenskii; R. V. Chernov

doi:10.1134/S1063784216100157

Analysis of reliability of semiconductor emitters with different designs of cavities

Authors: Ivanov A.V.¹, Kurnosov V.D.¹, Kurnosov K.V.¹, Kurnyavko Y.V.¹, Lobintsov A.V.¹, Meshkov A.S.¹, Penkin V.N.¹, Romantsevich V.I.¹, Uspenskii M.B.¹, Chernov R.V.¹
Affiliations:
1. Stelmakh Polyus Research Institute
Issue: Vol 61, No 10 (2016)
Pages: 1525-1530
Section: Solid State Electronics
URL: https://bakhtiniada.ru/1063-7842/article/view/198241
DOI: https://doi.org/10.1134/S1063784216100157
ID: 198241

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Abstract

We have reported on the results of analysis of the operating time of conventional laser diodes and diodes with noninjecting output sections. The reasons for shorter operating time of diodes with a single anti-reflection face of the cavity compared to diodes with two protecting coatings and emitters equipped with a fiber Bragg grating have been considered.