Investigation of the Hydrogen Etching Effect of the SiC Surface on the Formation of Graphene Films
- Авторлар: Lebedev S.P.1, Barash I.S.1, Eliseyev I.A.1, Dementev P.A.1, Lebedev A.A.1,2, Bulat P.V.3
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Мекемелер:
- Ioffe Institute
- St. Petersburg State Electrotechnical University LETI
- ITMO University
- Шығарылым: Том 64, № 12 (2019)
- Беттер: 1843-1849
- Бөлім: Physics of Low-Dimensional Structures
- URL: https://bakhtiniada.ru/1063-7842/article/view/204943
- DOI: https://doi.org/10.1134/S1063784219120144
- ID: 204943
Дәйексөз келтіру
Аннотация
We have studied the effect of temperature and etching duration of the 4H-SiC (0001) surface in hydrogen on the structural perfection of graphene films grown by thermal destruction. Several technological modes have been identified that enable etching of the substrate without changing the stoichiometric composition of the surface. It has been demonstrated that pregrowth etching in hydrogen at T = 1600°C with a duration of 1 min makes it possible to obtain a more uniform and structurally perfect graphene than etching at T = 1300°C with a 30 min duration.
Авторлар туралы
S. Lebedev
Ioffe Institute
Хат алмасуға жауапты Автор.
Email: lebedev.sergey@mail.ioffe.ru
Ресей, St. Petersburg, 194021
I. Barash
Ioffe Institute
Email: lebedev.sergey@mail.ioffe.ru
Ресей, St. Petersburg, 194021
I. Eliseyev
Ioffe Institute
Email: lebedev.sergey@mail.ioffe.ru
Ресей, St. Petersburg, 194021
P. Dementev
Ioffe Institute
Email: lebedev.sergey@mail.ioffe.ru
Ресей, St. Petersburg, 194021
A. Lebedev
Ioffe Institute; St. Petersburg State Electrotechnical University LETI
Email: lebedev.sergey@mail.ioffe.ru
Ресей, St. Petersburg, 194021; St. Petersburg, 197376
P. Bulat
ITMO University
Email: lebedev.sergey@mail.ioffe.ru
Ресей, St. Petersburg, 197101
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