Investigation of the Hydrogen Etching Effect of the SiC Surface on the Formation of Graphene Films
- Autores: Lebedev S.P.1, Barash I.S.1, Eliseyev I.A.1, Dementev P.A.1, Lebedev A.A.1,2, Bulat P.V.3
-
Afiliações:
- Ioffe Institute
- St. Petersburg State Electrotechnical University LETI
- ITMO University
- Edição: Volume 64, Nº 12 (2019)
- Páginas: 1843-1849
- Seção: Physics of Low-Dimensional Structures
- URL: https://bakhtiniada.ru/1063-7842/article/view/204943
- DOI: https://doi.org/10.1134/S1063784219120144
- ID: 204943
Citar
Resumo
We have studied the effect of temperature and etching duration of the 4H-SiC (0001) surface in hydrogen on the structural perfection of graphene films grown by thermal destruction. Several technological modes have been identified that enable etching of the substrate without changing the stoichiometric composition of the surface. It has been demonstrated that pregrowth etching in hydrogen at T = 1600°C with a duration of 1 min makes it possible to obtain a more uniform and structurally perfect graphene than etching at T = 1300°C with a 30 min duration.
Sobre autores
S. Lebedev
Ioffe Institute
Autor responsável pela correspondência
Email: lebedev.sergey@mail.ioffe.ru
Rússia, St. Petersburg, 194021
I. Barash
Ioffe Institute
Email: lebedev.sergey@mail.ioffe.ru
Rússia, St. Petersburg, 194021
I. Eliseyev
Ioffe Institute
Email: lebedev.sergey@mail.ioffe.ru
Rússia, St. Petersburg, 194021
P. Dementev
Ioffe Institute
Email: lebedev.sergey@mail.ioffe.ru
Rússia, St. Petersburg, 194021
A. Lebedev
Ioffe Institute; St. Petersburg State Electrotechnical University LETI
Email: lebedev.sergey@mail.ioffe.ru
Rússia, St. Petersburg, 194021; St. Petersburg, 197376
P. Bulat
ITMO University
Email: lebedev.sergey@mail.ioffe.ru
Rússia, St. Petersburg, 197101
Arquivos suplementares
