| Шығарылым |
Атауы |
Файл |
| Том 64, № 2 (2019) |
Annular Multi-Tip Field Emitters with Metal–Fullerene Protective Coatings |
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Sominskii G., Tumareva T., Taradaev E., Rukavitsyna A., Givargizov M., Stepanova A.
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| Том 64, № 3 (2019) |
Anomalies in the Elastic and Inelastic Properties of Cox(PZT)100 –x Nanocomposites |
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Tarasov D.
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| Том 61, № 2 (2016) |
Anomalies of the natural convection of water near 3.98°C |
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Baturov L., Govor I.
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| Том 64, № 7 (2019) |
Anomalous Behavior of Lateral C–V Characteristic of an MNOS Transistor with an Embedded Local Charge in the Nitride Layer |
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Atamuratova Z., Yusupov A., Khalikberdiev B., Atamuratov A.
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| Том 64, № 6 (2019) |
Anomalous Elastic and Inelastic Properties of the Cox(CaF2)100 –x Nanogranular Composites |
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Tarasov D.
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| Том 64, № 2 (2019) |
Anomalous Electrical Conductivity and Magnetization in Fe–Cr–Ni Austenite–Martensite Alloys |
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Protasov E., Petrovskii V., Mironov V.
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| Том 64, № 3 (2019) |
Anomaly of Microwave Absorption of Ice near –45°C under Plastic Deformation |
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Bordonskii G.
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| Том 64, № 7 (2019) |
Applicability Limits of the Holm–Kohlrausch Approximation to Determine Heating of High-Current Symmetrical Electric Contacts |
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Begal’ D., Pavleino M., Pavleino O., Safonov M., Statuya A.
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| Том 61, № 9 (2016) |
Application of aluminum and titanium foils in low-energy wide-aperture electron accelerators |
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Bodakin L., Gusakov A., Komarov O., Kosogorov S., Motovilov S., Uspenskii N.
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| Том 62, № 11 (2017) |
Application of permutation entropy method in the analysis of chaotic, noisy, and chaotic noisy series |
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Makarkin S., Starodubov A., Kalinin Y.
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| Том 64, № 11 (2019) |
Application of Planar Permalloy Microparticles for Detecting Mechanical Stresses |
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Nurgazizov N., Bizyaev D., Bukharaev A., Russkikh I., Sadchikov Y.
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| Том 64, № 6 (2019) |
Application of Quantum Scattering Theory in Calculation of the Simplest Chemical Reactions (Dissociative Attachment, Dissociation, and Recombination) |
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Pozdneev S.
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| Том 64, № 11 (2019) |
Application of Scanning Capacitance Force Microscopy for Detecting Impurity Phases in Ferroelectric Triglycine Sulfate |
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Gainutdinov R., Tolstikhina A., Lashkova A., Belugina N., Shut V., Mozzharov S., Kashevich I.
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| Том 63, № 11 (2018) |
Application of the Donkin Formula in the Theory of Electrostatic Prisms |
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Golikov Y., Berdnikov A., Antonov A., Krasnova N., Solov’ev K.
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| Том 64, № 12 (2019) |
Application of the Donkin Formula in the Theory of Reflecting and Turning Devices |
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Golikov Y., Berdnikov A., Antonov A., Krasnova N., Solov’ev K.
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| Том 62, № 1 (2017) |
Application of the model of delocalized atoms to metallic glasses |
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Sanditov D., Darmaev M., Sanditov B.
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| Том 61, № 1 (2016) |
Application of the solution–melt method for obtaining composite materials consisting of a metal matrix and CrSi2 microcrystals |
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Solomkin F., Novikov S., Kartenko N., Kolosova A., Pshenai-Severin D., Uryupin O., Samunin A., Isachenko G.
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| Том 61, № 12 (2016) |
Approximate expressions that describe the profiles of sessile and pendent drops for the cases of small Bond numbers and strong wetting |
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Galaktionov E., Galaktionova N., Tropp E.
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| Том 61, № 10 (2016) |
Approximation of the erosion zone profile in planar magnetrons with a disk cathode |
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Rogov A., Kapustin Y.
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| Том 61, № 5 (2016) |
Asymmetric planar luminescent waveguide based on amorphous silicon carbide with polarized radiation in leaky modes |
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Medvedev A., Dukin A., Feoktistov N., Golubev V.
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| Том 63, № 8 (2018) |
Atomic Force Microscopy Measurement of the Resistivity of Semiconductors |
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Smirnov V., Tominov R., Alyab’eva N., Il’ina M., Polyakova V., Bykov A., Ageev O.
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| Том 62, № 2 (2017) |
Atomic force microscopy of swelling and hardening of intact erythrocytes fixed on substrate |
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Khalisov M., Timoshchuk K., Ankudinov A., Timoshenko T.
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| Том 63, № 10 (2018) |
Atomic Layer Deposition of Thin Films onto 3D Nanostructures: The Effect of Wall Tilt Angle and Aspect Ratio of Trenches |
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Fadeev A., Rudenko K.
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| Том 64, № 11 (2019) |
Atomic-Force Microscopy of Resistive Nonstationary Signal Switching in ZrO2(Y) Films |
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Filatov D., Koryazhkina M., Antonov D., Antonov I., Liskin D., Ryabova M., Gorshkov O.
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| Том 61, № 7 (2016) |
Atomic-force microscopy of submicron films of electroactive polymer |
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Karamov D., Kornilov V., Lachinov A., Kraikin V., Ionova I.
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| Нәтижелер 1251 - 76/100 |
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