🔧На сайте запланированы технические работы
25.12.2025 в промежутке с 18:00 до 21:00 по Московскому времени (GMT+3) на сайте будут проводиться плановые технические работы. Возможны перебои с доступом к сайту. Приносим извинения за временные неудобства. Благодарим за понимание!
🔧Site maintenance is scheduled.
Scheduled maintenance will be performed on the site from 6:00 PM to 9:00 PM Moscow time (GMT+3) on December 25, 2025. Site access may be interrupted. We apologize for the inconvenience. Thank you for your understanding!

 

Growth and optical properties of filamentary GaN nanocrystals grown on a hybrid SiC/Si(111) substrate by molecular beam epitaxy


Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

The potential to grow filamentary GaN nanocrystals by molecular beam epitaxy on a silicon substrate with a nanosized buffer layer of silicon carbide has been demonstrated. Morphological and optical properties of the obtained system have been studied. It has been shown that the intensity of the photoluminescence spectrum peak of such structures is higher than that of the best filamentary GaN nanocrystals without the buffer silicon carbide layer by a factor of more than two.

Авторлар туралы

R. Reznik

St. Petersburg Academic University; Peter the Great St. Petersburg Polytechnic University; ITMO University

Хат алмасуға жауапты Автор.
Email: moment92@mail.ru
Ресей, ul. Khlopina 8/3, St. Petersburg, 194021; Politekhnicheskaya ul. 29, St. Petersburg, 195251; Kronverkskii pr. 49, St. Petersburg, 197101

K. Kotlyar

St. Petersburg Academic University; Ioffe Physiсal-Techniсal Institute

Email: moment92@mail.ru
Ресей, ul. Khlopina 8/3, St. Petersburg, 194021; Politekhnicheskaya ul. 26, St. Petersburg, 194021

I. Il’kiv

St. Petersburg Academic University; Peter the Great St. Petersburg Polytechnic University

Email: moment92@mail.ru
Ресей, ul. Khlopina 8/3, St. Petersburg, 194021; Politekhnicheskaya ul. 29, St. Petersburg, 195251

I. Soshnikov

St. Petersburg Academic University; Ioffe Physiсal-Techniсal Institute; St. Petersburg Electrotechnical University “LETI,”

Email: moment92@mail.ru
Ресей, ul. Khlopina 8/3, St. Petersburg, 194021; Politekhnicheskaya ul. 26, St. Petersburg, 194021; ul. Popova 5/5, St. Petersburg, 197376

S. Kukushkin

St. Petersburg Academic University; ITMO University; Institute of Problems of Mechanical Engineering

Email: moment92@mail.ru
Ресей, ul. Khlopina 8/3, St. Petersburg, 194021; Kronverkskii pr. 49, St. Petersburg, 197101; Bol’shoi pr. 61, St. Petersburg, 199178

A. Osipov

St. Petersburg Academic University; ITMO University; Institute of Problems of Mechanical Engineering

Email: moment92@mail.ru
Ресей, ul. Khlopina 8/3, St. Petersburg, 194021; Kronverkskii pr. 49, St. Petersburg, 197101; Bol’shoi pr. 61, St. Petersburg, 199178

E. Nikitina

St. Petersburg Academic University

Email: moment92@mail.ru
Ресей, ul. Khlopina 8/3, St. Petersburg, 194021

G. Cirlin

St. Petersburg Academic University; ITMO University; Institute for Analytical Instrumentation

Email: moment92@mail.ru
Ресей, ul. Khlopina 8/3, St. Petersburg, 194021; Kronverkskii pr. 49, St. Petersburg, 197101; Rizhskii pr. 26, St. Petersburg, 190103

Қосымша файлдар

Қосымша файлдар
Әрекет
1. JATS XML

© Pleiades Publishing, Ltd., 2016