The Proximity and Josephson Effects in Niobium Nitride–Aluminum Bilayers


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Аннотация

Highly disordered thin films of niobium nitride and the specific features of the proximity effect in NbN (S)–aluminum (N) bilayers with a large resistivity ratio, ρNbNAl\( \gg \) 1, are studied. It is shown that magnetic screening and the critical current Ic of such SN structures significantly increase compared to the S layer. The observed effect is associated with the induced superconductivity in the N layer due to the proximity effect. The Josephson effect is demonstrated in NbN/Al–NbN–NbN/Al variable thickness bridges made of such SN bilayers.

Авторлар туралы

M. Levichev

Institute for Physics of Microstructures, Russian Academy of Sciences

Email: a_klushin@ipmras.ru
Ресей, Nizhny Novgorod, 603950

A. El’kina

Institute for Physics of Microstructures, Russian Academy of Sciences

Email: a_klushin@ipmras.ru
Ресей, Nizhny Novgorod, 603950

N. Bukharov

Frunze Scientific and Production Association

Email: a_klushin@ipmras.ru
Ресей, Nizhny Novgorod, 603950

Yu. Petrov

St. Petersburg State University

Email: a_klushin@ipmras.ru
Ресей, St. Petersburg, 199034

A. Aladyshkin

Institute for Physics of Microstructures, Russian Academy of Sciences; Lobachevsky State University of Nizhny Novgorod

Email: a_klushin@ipmras.ru
Ресей, Nizhny Novgorod, 603950; Nizhny Novgorod, 603950

D. Vodolazov

Institute for Physics of Microstructures, Russian Academy of Sciences

Email: a_klushin@ipmras.ru
Ресей, Nizhny Novgorod, 603950

A. Klushin

Institute for Physics of Microstructures, Russian Academy of Sciences

Хат алмасуға жауапты Автор.
Email: a_klushin@ipmras.ru
Ресей, Nizhny Novgorod, 603950

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