Enviar artigo por via de e-mail Layer Crystallization in PZT/LNO/Si Heterostructures
- Autores: Atanova A.V.1, Zhigalina O.M.1,2, Khmelenin D.N.1, Seregin D.S.3, Vorotilov K.A.3
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Afiliações:
- Shubnikov Institute of Crystallography, Russian Academy of Sciences
- Bauman Moscow State Technical University
- Russian Technological University (MIREA)
- Edição: Volume 61, Nº 12 (2019)
- Páginas: 2464-2467
- Seção: Surface Physics and Thin Films
- URL: https://bakhtiniada.ru/1063-7834/article/view/207117
- DOI: https://doi.org/10.1134/S1063783419120035
- ID: 207117
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Resumo
A Pb(Zr0.52Ti0.48)O3–LaNiO3–Si composition and LaNiO3 thin films are synthesized using chemical solution deposition and studied by transmission electron microscopy. The polycrystalline, porous structure of LaNiO3 is found to misalign the columnar structure of lead zirconate titanate. The effect that thermal treatment has on the structure and phase composition of lanthanum nickelate is addressed. The morphological features of LaNiO3 film structure such as its layered character, porosity, and misalignment are observed in samples subjected to annealing at a temperature of 550°C and are more pronounced upon raising the temperature to 800°C.
Sobre autores
A. Atanova
Shubnikov Institute of Crystallography, Russian Academy of Sciences
Autor responsável pela correspondência
Email: atanova.a@crys.ras.ru
Rússia, Moscow
O. Zhigalina
Shubnikov Institute of Crystallography, Russian Academy of Sciences; Bauman Moscow State Technical University
Email: atanova.a@crys.ras.ru
Rússia, Moscow; Moscow
D. Khmelenin
Shubnikov Institute of Crystallography, Russian Academy of Sciences
Email: atanova.a@crys.ras.ru
Rússia, Moscow
D. Seregin
Russian Technological University (MIREA)
Email: atanova.a@crys.ras.ru
Rússia, Moscow
K. Vorotilov
Russian Technological University (MIREA)
Email: atanova.a@crys.ras.ru
Rússia, Moscow
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