Spin-Wave Resonance in Chemically Deposited Fe-Ni Films: Measuring the Spin-Wave Stiffness and Surface Anisotropy Constant


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Abstract

Single-layer FexNi1 - x thin magnetic films have been investigated by the spin-wave resonance technique in the entire concentration range. The surface anisotropy and exchange stiffness constants for the films with a Ni content from 30 to 80 at % have been measured from the experimental standing spin wave spectra. The surface exchange spin wave penetration depth δC = 20–30 nm has been determined from the dependences of the surface anisotropy and exchange coupling constants on the Fe20Ni80 film thickness in the range of 250–400 nm.

About the authors

I. G. Vazhenina

Kirensky Institute of Physics

Author for correspondence.
Email: irina-vazhenina@mail.ru
Russian Federation, Krasnoyarsk, 660036

R. S. Iskhakov

Kirensky Institute of Physics

Email: irina-vazhenina@mail.ru
Russian Federation, Krasnoyarsk, 660036

L. A. Chekanova

Kirensky Institute of Physics

Email: irina-vazhenina@mail.ru
Russian Federation, Krasnoyarsk, 660036

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