Spin-Wave Resonance in Chemically Deposited Fe-Ni Films: Measuring the Spin-Wave Stiffness and Surface Anisotropy Constant
- Authors: Vazhenina I.G.1, Iskhakov R.S.1, Chekanova L.A.1
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Affiliations:
- Kirensky Institute of Physics
- Issue: Vol 60, No 2 (2018)
- Pages: 292-298
- Section: Magnetism
- URL: https://bakhtiniada.ru/1063-7834/article/view/202055
- DOI: https://doi.org/10.1134/S1063783418020294
- ID: 202055
Cite item
Abstract
Single-layer FexNi1 - x thin magnetic films have been investigated by the spin-wave resonance technique in the entire concentration range. The surface anisotropy and exchange stiffness constants for the films with a Ni content from 30 to 80 at % have been measured from the experimental standing spin wave spectra. The surface exchange spin wave penetration depth δC = 20–30 nm has been determined from the dependences of the surface anisotropy and exchange coupling constants on the Fe20Ni80 film thickness in the range of 250–400 nm.
About the authors
I. G. Vazhenina
Kirensky Institute of Physics
Author for correspondence.
Email: irina-vazhenina@mail.ru
Russian Federation, Krasnoyarsk, 660036
R. S. Iskhakov
Kirensky Institute of Physics
Email: irina-vazhenina@mail.ru
Russian Federation, Krasnoyarsk, 660036
L. A. Chekanova
Kirensky Institute of Physics
Email: irina-vazhenina@mail.ru
Russian Federation, Krasnoyarsk, 660036
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