Structural and optical properties of single and bilayer silver and gold films


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An experimental study of structural and optical properties of silver and gold thin films, as well as bilayer films based on these metals, has been carried out. To study properties of nanofilms, reflection spectra upon excitation of surface plasmons in the Kretschmann geometry and spectra of ellipsometric parameters have been investigated. The reflection spectra were analyzed using a theoretical model for determining (effective) dielectric constants of the films. The calculated dielectric constants of the films differ from data obtained by ellipsometry. The features in determining dielectric constants by different methods and characteristics of manufactured films in relation to the influence of the substrate are discussed.

Sobre autores

G. Yankovskii

Dukhov All-Russia Research Institute of Automatics; MISiS National University of Science and Technology

Autor responsável pela correspondência
Email: gyankovskii@mail.ru
Rússia, ul. Sushchevskaya 22, Moscow, 127055; Leninskii pr. 4, Moscow, 119049

A. Komarov

Dukhov All-Russia Research Institute of Automatics; Moscow Institute of Physics and Technology (State University)

Email: gyankovskii@mail.ru
Rússia, ul. Sushchevskaya 22, Moscow, 127055; Institutskii per. 9, Dolgoprudnyi, Moscow oblast, 141700

R. Puz’ko

Dukhov All-Russia Research Institute of Automatics; Moscow Institute of Physics and Technology (State University)

Email: gyankovskii@mail.ru
Rússia, ul. Sushchevskaya 22, Moscow, 127055; Institutskii per. 9, Dolgoprudnyi, Moscow oblast, 141700

A. Baryshev

Dukhov All-Russia Research Institute of Automatics; Moscow Institute of Physics and Technology (State University); Ioffe Institute

Email: gyankovskii@mail.ru
Rússia, ul. Sushchevskaya 22, Moscow, 127055; Institutskii per. 9, Dolgoprudnyi, Moscow oblast, 141700; Politekhnicheskaya ul. 26, St. Petersburg, 194021

K. Afanas’ev

Dukhov All-Russia Research Institute of Automatics; Institute for Theoretical and Applied Electrodynamics; Bauman Moscow State Technical University

Email: gyankovskii@mail.ru
Rússia, ul. Sushchevskaya 22, Moscow, 127055; ul. Izhorskaya 13, Moscow, 125412; Vtoraya Baumanskaya ul. 5, Moscow, 107005

I. Boginskaya

Dukhov All-Russia Research Institute of Automatics; Institute for Theoretical and Applied Electrodynamics; Bauman Moscow State Technical University

Email: gyankovskii@mail.ru
Rússia, ul. Sushchevskaya 22, Moscow, 127055; ul. Izhorskaya 13, Moscow, 125412; Vtoraya Baumanskaya ul. 5, Moscow, 107005

I. Bykov

Dukhov All-Russia Research Institute of Automatics; Institute for Theoretical and Applied Electrodynamics; Bauman Moscow State Technical University

Email: gyankovskii@mail.ru
Rússia, ul. Sushchevskaya 22, Moscow, 127055; ul. Izhorskaya 13, Moscow, 125412; Vtoraya Baumanskaya ul. 5, Moscow, 107005

A. Merzlikin

Dukhov All-Russia Research Institute of Automatics; Moscow Institute of Physics and Technology (State University); Institute for Theoretical and Applied Electrodynamics

Email: gyankovskii@mail.ru
Rússia, ul. Sushchevskaya 22, Moscow, 127055; Institutskii per. 9, Dolgoprudnyi, Moscow oblast, 141700; ul. Izhorskaya 13, Moscow, 125412

I. Rodionov

Dukhov All-Russia Research Institute of Automatics; Bauman Moscow State Technical University

Email: gyankovskii@mail.ru
Rússia, ul. Sushchevskaya 22, Moscow, 127055; Vtoraya Baumanskaya ul. 5, Moscow, 107005

I. Ryzhikov

Dukhov All-Russia Research Institute of Automatics; Institute for Theoretical and Applied Electrodynamics; Bauman Moscow State Technical University

Email: gyankovskii@mail.ru
Rússia, ul. Sushchevskaya 22, Moscow, 127055; ul. Izhorskaya 13, Moscow, 125412; Vtoraya Baumanskaya ul. 5, Moscow, 107005

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