🔧На сайте запланированы технические работы
25.12.2025 в промежутке с 18:00 до 21:00 по Московскому времени (GMT+3) на сайте будут проводиться плановые технические работы. Возможны перебои с доступом к сайту. Приносим извинения за временные неудобства. Благодарим за понимание!
🔧Site maintenance is scheduled.
Scheduled maintenance will be performed on the site from 6:00 PM to 9:00 PM Moscow time (GMT+3) on December 25, 2025. Site access may be interrupted. We apologize for the inconvenience. Thank you for your understanding!

 

Phosphorus-Based Nanowires Grown by Molecular-Beam Epitaxy on Silicon


Cite item

Full Text

Open Access Open Access
Restricted Access Access granted
Restricted Access Subscription Access

Abstract

Data on the growth and physical properties of nanostructures of the type “InAsP insert embedded in InP nanowire (NW)” grown on Si (111) surfaces by Au-assisted molecular-beam epitaxy are presented. It is found that nearly 100%-coherent NWs can be grown with a widely varying surface density. A relationship between the optical and structural properties of the NWs is revealed. It is shown that the NWs under study are formed of a purely wurtzite phase. The suggested technology opens up new opportunities for the integration of direct-gap III–V materials and silicon.

About the authors

G. E. Cirlin

St. Petersburg Academic University, Russian Academy of Sciences; Institute for Analytical Instrumentation, Russian Academy of Sciences; ITMO University; Ioffe Institute

Author for correspondence.
Email: cirlin@beam.ioffe.ru
Russian Federation, St. Petersburg, 194021; St. Petersburg, 190103; St. Petersburg, 197101; St. Petersburg, 194021

R. R. Reznik

ITMO University

Email: cirlin@beam.ioffe.ru
Russian Federation, St. Petersburg, 197101

Yu. B. Samsonenko

St. Petersburg Academic University, Russian Academy of Sciences; Institute for Analytical Instrumentation, Russian Academy of Sciences

Email: cirlin@beam.ioffe.ru
Russian Federation, St. Petersburg, 194021; St. Petersburg, 190103

A. I. Khrebtov

St. Petersburg Academic University, Russian Academy of Sciences; ITMO University

Email: cirlin@beam.ioffe.ru
Russian Federation, St. Petersburg, 194021; St. Petersburg, 197101

K. P. Kotlyar

St. Petersburg Academic University, Russian Academy of Sciences

Email: cirlin@beam.ioffe.ru
Russian Federation, St. Petersburg, 194021

I. V. Ilkiv

St. Petersburg Academic University, Russian Academy of Sciences

Email: cirlin@beam.ioffe.ru
Russian Federation, St. Petersburg, 194021

I. P. Soshnikov

St. Petersburg Academic University, Russian Academy of Sciences; Institute for Analytical Instrumentation, Russian Academy of Sciences; Ioffe Institute

Email: cirlin@beam.ioffe.ru
Russian Federation, St. Petersburg, 194021; St. Petersburg, 190103; St. Petersburg, 194021

D. A. Kirilenko

Ioffe Institute

Email: cirlin@beam.ioffe.ru
Russian Federation, St. Petersburg, 194021

N. V. Kryzhanovskaya

St. Petersburg Academic University, Russian Academy of Sciences

Email: cirlin@beam.ioffe.ru
Russian Federation, St. Petersburg, 194021

Supplementary files

Supplementary Files
Action
1. JATS XML

Copyright (c) 2018 Pleiades Publishing, Ltd.