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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
Home > Search > Browse Author Index

Browse Author Index

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All

I

Ismailov, A. M.
Ismailov, D. I.
Ismayilov, D. I.
Isupov, A. Yu.
Iurov, A. S.
Ivakhnenko, S. G.
Ivanchenko, M. V.
Ivanenko, I. P.
Ivankov, O. I.
Ivannikov, P.
Ivanov, B. S.
Ivanov, D. A.
Ivanov, I. V.
Ivanov, K. V.
Ivanov, N.
Ivanov, S. Yu.
Ivanov, V. K.
Ivanov, Y. F.
Ivanov, Yu. F.
Ivanova, A. I.
Ivanova, N. M.
Ivanova, O. V.
Ivanova, S. V.
Ivanove, V. K.
Ivashchuk, O. O.

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