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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All

S

Sabbatovsky, K. G.
Sabirov, A. S.
Sabirzyanov, N. A.
Sabitov, D. R.
Sachkov, M. E.
Sadigov, R. M.
Sadilov, V. V.
Sadovoy, V.
Sadovskaya, N. V.
Sadykov, R. A.
Sadykova, I. R.
Safaraliev, G. K.
Safonov, D. A.
Safonov, R. A.
Sakhno, S. V.
Salamatov, Yu. A.
Salashchenko, N. N.
Salnikov, V. V.
Samedova, Z. A.
Samigullina, R. F.
Samkanashvili, D. G.
Samoilenko, S. O.
Samoilov, V. N.
Samoylova, N. Yu.
Samoylovich, M. I.

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