Semiconductor Sensors for Studying the Heterogeneous Destruction of Ozone at Low Concentrations

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Prospects for the use of semiconductor resistive sensors in studies of the heterogeneous destruction of ozone at low concentrations (5–400 μg/m3) were shown. The influence of various factors (sensor temperature, gas flow rate, ozone concentration) on the results of ozone concentration measurements with sensors of various types was studied. Methods for forming a sensitive layer of In2O3(3% Fe2O3) sensors with specified parameters of calibration curves were proposed. The optimum conditions for the operation of sensors in a flow mode were formulated. The results of the study of heterogeneous destruction of ozone on microfiber polymer and natural disperse (sand, coals) materials obtained by the developed method were presented.

作者简介

L. Obvintseva

Karpov Institute of Physical Chemistry

编辑信件的主要联系方式.
Email: obvint@yandex.ru
俄罗斯联邦, Moscow, 105064

T. Sharova

Karpov Institute of Physical Chemistry

Email: obvint@yandex.ru
俄罗斯联邦, Moscow, 105064

A. Avetisov

Karpov Institute of Physical Chemistry

Email: obvint@yandex.ru
俄罗斯联邦, Moscow, 105064

I. Sukhareva

Karpov Institute of Physical Chemistry

Email: obvint@yandex.ru
俄罗斯联邦, Moscow, 105064

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