Nanoporosity of Si (100) bars


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Аннотация

Si(100) samples cut from a typical bar (100 mm in diameter) prepared using industrial technology are studied. Measurements of the electron work function (EWF) show that the size effects in these samples (a reduction in thickness along with a sample’s area and the EWF) detected earlier were due to nanostructure porosity that was buried by the technological treatment of a bar’s surface. This hidden nanoporosity is assumed to be a manifestation of the secondary crystal structure.

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Авторлар туралы

N. Gerasimenko

National Research University of Electronic Technology (MIET); Lebedev Institute of Physics; National Research Tomsk State University

Email: aviary@mail.ru
Ресей, Moscow, 124498; Moscow, 119991; Tomsk, 634050

D. Smirnov

National Research University of Electronic Technology (MIET); Lebedev Institute of Physics

Email: aviary@mail.ru
Ресей, Moscow, 124498; Moscow, 119991

S. Novikov

National Research University of Electronic Technology (MIET)

Хат алмасуға жауапты Автор.
Email: aviary@mail.ru
Ресей, Moscow, 124498

S. Timoshenkov

National Research University of Electronic Technology (MIET)

Email: aviary@mail.ru
Ресей, Moscow, 124498

V. Minaev

National Research University of Electronic Technology (MIET)

Email: aviary@mail.ru
Ресей, Moscow, 124498

E. Goryunova

National Research University of Electronic Technology (MIET)

Email: aviary@mail.ru
Ресей, Moscow, 124498

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