The Determining Role of the (HF2)– Ion in the Formation of Pores in Silicon in Its Electrochemical Etching with Hydrofluoric Acid Solutions
- Autores: Abramova E.N.1, Khort A.M.1, Yakovenko A.G.1, Slipchenko E.A.1, Kornilova D.S.1, Tsygankova M.V.1, Shvets V.I.1
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Afiliações:
- Institute of Fine Chemical Technologies
- Edição: Volume 63, Nº 9 (2018)
- Páginas: 1236-1242
- Seção: Physical Chemistry of Solutions
- URL: https://bakhtiniada.ru/0036-0236/article/view/168996
- DOI: https://doi.org/10.1134/S0036023618090024
- ID: 168996
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Resumo
A model of the chemical interaction of Si with the (HF2)– ion was propsoed to explain some experimental data on the formation of porous silicon.
Sobre autores
E. Abramova
Institute of Fine Chemical Technologies
Email: anavenko@yandex.ru
Rússia, Moscow, 119571
A. Khort
Institute of Fine Chemical Technologies
Autor responsável pela correspondência
Email: anavenko@yandex.ru
Rússia, Moscow, 119571
A. Yakovenko
Institute of Fine Chemical Technologies
Email: anavenko@yandex.ru
Rússia, Moscow, 119571
E. Slipchenko
Institute of Fine Chemical Technologies
Email: anavenko@yandex.ru
Rússia, Moscow, 119571
D. Kornilova
Institute of Fine Chemical Technologies
Email: anavenko@yandex.ru
Rússia, Moscow, 119571
M. Tsygankova
Institute of Fine Chemical Technologies
Email: anavenko@yandex.ru
Rússia, Moscow, 119571
V. Shvets
Institute of Fine Chemical Technologies
Email: anavenko@yandex.ru
Rússia, Moscow, 119571
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