🔧На сайте запланированы технические работы
25.12.2025 в промежутке с 18:00 до 21:00 по Московскому времени (GMT+3) на сайте будут проводиться плановые технические работы. Возможны перебои с доступом к сайту. Приносим извинения за временные неудобства. Благодарим за понимание!
🔧Site maintenance is scheduled.
Scheduled maintenance will be performed on the site from 6:00 PM to 9:00 PM Moscow time (GMT+3) on December 25, 2025. Site access may be interrupted. We apologize for the inconvenience. Thank you for your understanding!

 

The Determining Role of the (HF2) Ion in the Formation of Pores in Silicon in Its Electrochemical Etching with Hydrofluoric Acid Solutions


Citar

Texto integral

Acesso aberto Acesso aberto
Acesso é fechado Acesso está concedido
Acesso é fechado Somente assinantes

Resumo

A model of the chemical interaction of Si with the (HF2) ion was propsoed to explain some experimental data on the formation of porous silicon.

Sobre autores

E. Abramova

Institute of Fine Chemical Technologies

Email: anavenko@yandex.ru
Rússia, Moscow, 119571

A. Khort

Institute of Fine Chemical Technologies

Autor responsável pela correspondência
Email: anavenko@yandex.ru
Rússia, Moscow, 119571

A. Yakovenko

Institute of Fine Chemical Technologies

Email: anavenko@yandex.ru
Rússia, Moscow, 119571

E. Slipchenko

Institute of Fine Chemical Technologies

Email: anavenko@yandex.ru
Rússia, Moscow, 119571

D. Kornilova

Institute of Fine Chemical Technologies

Email: anavenko@yandex.ru
Rússia, Moscow, 119571

M. Tsygankova

Institute of Fine Chemical Technologies

Email: anavenko@yandex.ru
Rússia, Moscow, 119571

V. Shvets

Institute of Fine Chemical Technologies

Email: anavenko@yandex.ru
Rússia, Moscow, 119571

Arquivos suplementares

Arquivos suplementares
Ação
1. JATS XML

Declaração de direitos autorais © Pleiades Publishing, Ltd., 2018