Computer diffraction tomography. Digital image processing and analysis based on the 1D-, 2D-sized guided and wavelet-function filter processing.

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Abstract

One presents and analyzes the results of computer processing for a plane-wave X-ray topography imaging of a point defect of the Coulomb-types in the Si(111) crystal recorded by an X-ray detector against a background of the Gaussian noise, and their subsequent filtering by using the 1D-, 2D-sized guided and a heuristic wavelet 4th-order Daubechie’s atomic function. The filtering efficiency of a topography image is determined by the parameter of the averaged over all pixels relative square deviations of the pixel intensities (RMS.) of the processed and reference (noise-free) 2D image. Practical methods for selecting filtration parameters are proposed, using which the considered methods work well enough to be used in practice for the noise processing of plane-wave X-ray topography images, meaning their use for the 3D digital recovering nanosized crystal defects.

About the authors

V. I. Bondarenko

Shubnikov Institute of Crystallography of the Kurchatov Complex Crystallography and Photonics of the NRC “Kurchatov Institute”

Email: bondarenko.v@crys.ras.ru
Russian Federation, Moscow, 119333

S. S. Rekhviashvili

Institute of Applied Mathematics and Automation KBSC RAS

Email: bondarenko.v@crys.ras.ru
Russian Federation, Nalchik, 360000

F. N. Chukhovskii

Shubnikov Institute of Crystallography of the Kurchatov Complex Crystallography and Photonics of the NRC “Kurchatov Institute”; Institute of Applied Mathematics and Automation KBSC RAS

Author for correspondence.
Email: bondarenko.v@crys.ras.ru
Russian Federation, Moscow, 119333; Nalchik, 360000

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In the print version, the article was published under the DOI: 10.31857/S0023476125040029


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