Computer diffraction tomography. Digital image processing and analysis based on the 1D-, 2D-sized guided and wavelet-function filter processing.
- 作者: Bondarenko V.I.1, Rekhviashvili S.S.2, Chukhovskii F.N.1,2
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隶属关系:
- Shubnikov Institute of Crystallography of the Kurchatov Complex Crystallography and Photonics of the NRC “Kurchatov Institute”
- Institute of Applied Mathematics and Automation KBSC RAS
- 期: 卷 70, 编号 4 (2025)
- 页面: 552-559
- 栏目: ДИФРАКЦИЯ И РАССЕЯНИЕ ИОНИЗИРУЮЩИХ ИЗЛУЧЕНИЙ
- URL: https://bakhtiniada.ru/0023-4761/article/view/306260
- DOI: https://doi.org/10.31857/S0023476125040029
- EDN: https://elibrary.ru/jewkkg
- ID: 306260
如何引用文章
详细
One presents and analyzes the results of computer processing for a plane-wave X-ray topography imaging of a point defect of the Coulomb-types in the Si(111) crystal recorded by an X-ray detector against a background of the Gaussian noise, and their subsequent filtering by using the 1D-, 2D-sized guided and a heuristic wavelet 4th-order Daubechie’s atomic function. The filtering efficiency of a topography image is determined by the parameter of the averaged over all pixels relative square deviations of the pixel intensities (RMS.) of the processed and reference (noise-free) 2D image. Practical methods for selecting filtration parameters are proposed, using which the considered methods work well enough to be used in practice for the noise processing of plane-wave X-ray topography images, meaning their use for the 3D digital recovering nanosized crystal defects.
作者简介
V. Bondarenko
Shubnikov Institute of Crystallography of the Kurchatov Complex Crystallography and Photonics of the NRC “Kurchatov Institute”
Email: bondarenko.v@crys.ras.ru
俄罗斯联邦, Moscow, 119333
S. Rekhviashvili
Institute of Applied Mathematics and Automation KBSC RAS
Email: bondarenko.v@crys.ras.ru
俄罗斯联邦, Nalchik, 360000
F. Chukhovskii
Shubnikov Institute of Crystallography of the Kurchatov Complex Crystallography and Photonics of the NRC “Kurchatov Institute”; Institute of Applied Mathematics and Automation KBSC RAS
编辑信件的主要联系方式.
Email: bondarenko.v@crys.ras.ru
俄罗斯联邦, Moscow, 119333; Nalchik, 360000
参考
- Authier A. Dynamical Theory of X-ray Diffraction. New York: Oxford University Press, 2001. 680 p.
- Asadchikov V., Buzmakov A., Chukhovskii F. et al. // J. Appl. Cryst. 2018. V. 51. P. 1616. https://doi.org/10.1107/S160057671801419X
- Бондаренко В.И., Конарев П.В., Чуховский Ф.Н. // Кристаллография. 2020. Т. 65. № 6. С. 845. https://doi.org/10.31857/S0023476120060090
- Chukhovskii F.N., Konarev P.V., Volkov V.V. // Acta Cryst. A. 2020. V. 76. P. 16. https://doi.org/10.1107/S2053273320000145
- Hendriksen A.A., Bührer M., Leone L. et al. // Sci. Rep. 2021. V. 11. P. 11895. https://doi.org/10.1038/s41598-021-91084-8
- Chukhovskii F.N., Konarev P.V., Volkov V.V. // Crystals. 2024. V. 14. P. 29. https://doi.org/10.3390/cryst14010029
- Бондаренко В.И., Рехвиашвили C.Ш., Чуховский Ф.Н. // Кристаллография. 2024. Т. 69. № 5. С. 755. https://doi.org/10.31857/S0023476124050012
- Welstead S. Fractal and Wavelet Image Compression Techniques. SPIE Publications, 1999. 254 p.
- He K., Sun J., Tang X. // IEEE Trans. Pattern Anal. Machine Intell. 2013. V. 35. № 6. P. 1397. https://doi.org/10.1109/TPAMI.2012.213
- Nagajyothi G., Raghuveera E. // Int. J. Adv. Res. Electron. Commun. Eng. 2016. V. 5. P. 2362.
- Li Z., Zheng J., Zhu Z. et al. // IEEE Trans. Image Process. 2015. V. 24. P. 120. https://doi.org/10.1109/TIP.2014.2371234
- Zhang Y.Q., Ding Y., Liu J. // IET Image Process. 2013. V. 7. № 3. P. 270. https://doi.org/10.1049/iet-ipr.2012.0351
- Zhu S., Yu Z. // IET Image Process. 2020. V. 14. № 11. P. 2561. https://doi.org/10.1049/iet-ipr.2019.1471
- Малла С. Вейвлеты в обработке сигналов. М.: Мир, 2005. 671 с.
- Гонсалес Р., Вудс Р. Цифровая обработка изображений. М.: Техносфера, 2005. 1072 с.
- Дремин И.М., Иванов О.В., Нечитайло В.А. // Успехи физ. наук. 2001. Т. 171. № 5. С. 465. https://doi.org/10.3367/UFNr.0171.200105a.0465
- Уэлстид С. Фракталы и вейвлеты для сжатия изображений в действии. М.: Триумф, 2003. 320 с.
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