The Total-Reflection X-Ray Fluorescence Yield Formed by a Waveguide Resonator under Conditions of Ion Beam Excitation


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Abstract

The features of methods for total-reflection X-ray fluorescence analysis with proton-induced X‑ray fluorescence emission are described. A setup for obtaining X-ray fluorescence spectra under the conditions of proton-beam excitation has been developed using these methods. The setup is based on a specially designed planar X-ray waveguide resonator. The features of the new experimental diagnostic method in the unique research facility (UNU no. 45) of the Sokol-3 analytical ion-beam complex are discussed; some attention has been paid to the description of the capabilities of this facility.

About the authors

M. S. Afanasiev

Fryazino Branch of the Kotel’nikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences

Email: hed1317@mail.ru
Russian Federation, Fryazino, Moscow oblast, 141190

V. K. Egorov

Institute of Microelectronics Technology and High Purity Materials, Russian Academy of Sciences

Author for correspondence.
Email: hed1317@mail.ru
Russian Federation, Chernogolovka, Moscow oblast, 142432

E. V. Egorov

Fryazino Branch of the Kotel’nikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences; Institute of Microelectronics Technology and High Purity Materials, Russian Academy of Sciences

Email: hed1317@mail.ru
Russian Federation, Fryazino, Moscow oblast, 141190; Chernogolovka, Moscow oblast, 142432

N. F. Kuharskaya

Fryazino Branch of the Kotel’nikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences

Email: hed1317@mail.ru
Russian Federation, Fryazino, Moscow oblast, 141190

A. E. Nabiev

Azerbaijan State Pedagogical University

Email: hed1317@mail.ru
Azerbaijan, Baku, AZ1000

V. G. Naryshkina

Fryazino Branch of the Kotel’nikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences

Email: hed1317@mail.ru
Russian Federation, Fryazino, Moscow oblast, 141190

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