The Total-Reflection X-Ray Fluorescence Yield Formed by a Waveguide Resonator under Conditions of Ion Beam Excitation


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详细

The features of methods for total-reflection X-ray fluorescence analysis with proton-induced X‑ray fluorescence emission are described. A setup for obtaining X-ray fluorescence spectra under the conditions of proton-beam excitation has been developed using these methods. The setup is based on a specially designed planar X-ray waveguide resonator. The features of the new experimental diagnostic method in the unique research facility (UNU no. 45) of the Sokol-3 analytical ion-beam complex are discussed; some attention has been paid to the description of the capabilities of this facility.

作者简介

M. Afanasiev

Fryazino Branch of the Kotel’nikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences

Email: hed1317@mail.ru
俄罗斯联邦, Fryazino, Moscow oblast, 141190

V. Egorov

Institute of Microelectronics Technology and High Purity Materials, Russian Academy of Sciences

编辑信件的主要联系方式.
Email: hed1317@mail.ru
俄罗斯联邦, Chernogolovka, Moscow oblast, 142432

E. Egorov

Fryazino Branch of the Kotel’nikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences; Institute of Microelectronics Technology and High Purity Materials, Russian Academy of Sciences

Email: hed1317@mail.ru
俄罗斯联邦, Fryazino, Moscow oblast, 141190; Chernogolovka, Moscow oblast, 142432

N. Kuharskaya

Fryazino Branch of the Kotel’nikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences

Email: hed1317@mail.ru
俄罗斯联邦, Fryazino, Moscow oblast, 141190

A. Nabiev

Azerbaijan State Pedagogical University

Email: hed1317@mail.ru
阿塞拜疆, Baku, AZ1000

V. Naryshkina

Fryazino Branch of the Kotel’nikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences

Email: hed1317@mail.ru
俄罗斯联邦, Fryazino, Moscow oblast, 141190

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