An Instrument for Highly Specific Detection of Biomarkers on a Quartz Resonator


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Abstract

An instrument has been developed for measuring the force of affine interactions, in particular, in biological systems. The structure of the instrument is described. It includes a replaceable cartridge with a quartz resonator for analyzing various biosystems by measuring the signal of detachment of molecules from the resonator surface. The instrument is a sensor device with which it is possible to analyze various biological objects, including viruses and bacteria, as well as to carry out DNA identification. Software has been developed to automate the processing of results and the identification of objects. The instrument can be used to carry out express analysis in medical institutions and research laboratories.

About the authors

F. N. Dultsev

Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences; Novosibirsk State University

Author for correspondence.
Email: fdultsev@isp.nsc.ru
Russian Federation, Novosibirsk, 630090; Novosibirsk, 630090

D. V. Nekrasov

Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences

Email: fdultsev@isp.nsc.ru
Russian Federation, Novosibirsk, 630090

E. A. Kolosovsky

Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences

Email: fdultsev@isp.nsc.ru
Russian Federation, Novosibirsk, 630090

A. V. Gusachenko

Technological Design Institute of Applied Microelectronics, Novosibirsk Branch of the Rzhanov Institute
of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences

Email: fdultsev@isp.nsc.ru
Russian Federation, Novosibirsk, 630090

A. A. Moiseev

Technological Design Institute of Applied Microelectronics, Novosibirsk Branch of the Rzhanov Institute
of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences

Email: fdultsev@isp.nsc.ru
Russian Federation, Novosibirsk, 630090

V. V. Vasilev

Technological Design Institute of Applied Microelectronics, Novosibirsk Branch of the Rzhanov Institute
of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences

Email: fdultsev@isp.nsc.ru
Russian Federation, Novosibirsk, 630090

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