BN, AlN, GaN, InN: Charge Neutrality Level, Surface, Interfaces, Doping


如何引用文章

全文:

开放存取 开放存取
受限制的访问 ##reader.subscriptionAccessGranted##
受限制的访问 订阅存取

详细

On the basis of the charge neutrality concept, the analysis is fulfilled of the experimental data on the electron properties of the defective semiconductors after the radiation exposure, the electronic parameters of interfaces, surface work function and efficiency of doping with the impurities of high solubility in the nitrides of the group wz-III-N (BN, AlN, GaN, InN). The numerical evaluations of the charge neutrality levels in these compounds are presented.

作者简介

V. Brudnyi

National Research Tomsk State University

编辑信件的主要联系方式.
Email: brudnyi@mail.tsu.ru
俄罗斯联邦, Tomsk

补充文件

附件文件
动作
1. JATS XML

版权所有 © Springer Science+Business Media New York, 2017