Variation in the Local Material Temperature During Electron Beam Treatment and its Influence on the Modified Layer Properties
- Autores: Krysina O.V.1, Teresov A.D.1, Moskvin P.V.1, Koval N.N.1, Ivanov Y.F.1, Akhmadeev Y.H.1, Lopatin I.V.1
-
Afiliações:
- Institute of High Current Electronics of the Siberian Branch of the Russian Academy of Sciences
- Edição: Volume 62, Nº 7 (2019)
- Páginas: 1139-1146
- Seção: Article
- URL: https://bakhtiniada.ru/1064-8887/article/view/242033
- DOI: https://doi.org/10.1007/s11182-019-01828-3
- ID: 242033
Citar
Resumo
The local temperatures on the surface of a ceramic coating – aluminum substrate system are measured during its irradiation with a submillisecond pulsed electron beam. Certain parameters, such as electron beam density, pulse duration, and thickness of a TiCuN-coating, are varied. The optimal modes for electron beam irradiation of the TiCuN-coating – А7-substrate system are identified.
Sobre autores
O. Krysina
Institute of High Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Autor responsável pela correspondência
Email: krysina_82@mail.ru
Rússia, Tomsk
A. Teresov
Institute of High Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: krysina_82@mail.ru
Rússia, Tomsk
P. Moskvin
Institute of High Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: krysina_82@mail.ru
Rússia, Tomsk
N. Koval
Institute of High Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: krysina_82@mail.ru
Rússia, Tomsk
Yu. Ivanov
Institute of High Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: krysina_82@mail.ru
Rússia, Tomsk
Yu. Akhmadeev
Institute of High Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: krysina_82@mail.ru
Rússia, Tomsk
I. Lopatin
Institute of High Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: krysina_82@mail.ru
Rússia, Tomsk
Arquivos suplementares
