Properties of Nanocomposite Nickel-Carbon Films Deposited by Magnetron Sputtering
- Authors: Grenadyorov A.S.1, Oskomov K.V.1, Solov’ev A.A.1,2, Rabotkin S.V.1, Zakharov A.N.1, Semenov V.A.1, Oskirko V.O.1, Yelgin Y.I.2, Korneva O.S.2
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Affiliations:
- Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences
- National Research Tomsk Polytechnic University
- Issue: Vol 60, No 8 (2017)
- Pages: 1285-1290
- Section: Article
- URL: https://bakhtiniada.ru/1064-8887/article/view/238548
- DOI: https://doi.org/10.1007/s11182-017-1209-1
- ID: 238548
Cite item
Abstract
The method of magnetron sputtering was used to produce a-C and a-C:Ni films on substrates of monocrystalline silicon and thermoelectric material of n-type ((Bi2Te3)0.94(Bi2Se3)0.06) and p-type ((Bi2Te3)0.20(Sb2Te3)0.80) conductivity. The authors studied the effect of Ni concentration on specific electric resistance, hardness and adhesion of the produced films. It was demonstrated that specific resistance of a-C films deposited by graphite target sputtering when supplying high bias voltage onto the substrate can be reduced by increasing the share of graphitized carbon. Adding Ni to such films allows additionally reducing their specific resistance. The increase in Ni content is accompanied with the decrease in hardness and adhesion of a-C:Ni films. The acquired values of specific electric resistance and adhesion of a-C:Ni films to thermoelectric materials allow using them as barrier anti-diffusion coatings of thermoelectric modules.
About the authors
A. S. Grenadyorov
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Author for correspondence.
Email: 1711sasha@mail.ru
Russian Federation, Tomsk
K. V. Oskomov
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: 1711sasha@mail.ru
Russian Federation, Tomsk
A. A. Solov’ev
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences; National Research Tomsk Polytechnic University
Email: 1711sasha@mail.ru
Russian Federation, Tomsk; Tomsk
S. V. Rabotkin
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: 1711sasha@mail.ru
Russian Federation, Tomsk
A. N. Zakharov
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: 1711sasha@mail.ru
Russian Federation, Tomsk
V. A. Semenov
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: 1711sasha@mail.ru
Russian Federation, Tomsk
V. O. Oskirko
Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: 1711sasha@mail.ru
Russian Federation, Tomsk
Yu. I. Yelgin
National Research Tomsk Polytechnic University
Email: 1711sasha@mail.ru
Russian Federation, Tomsk
O. S. Korneva
National Research Tomsk Polytechnic University
Email: 1711sasha@mail.ru
Russian Federation, Tomsk
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