Hexagonal AlN Layers Grown on Sulfided Si(100) Substrate


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We have studied the influence of sulfide passivation on the initial stages of aluminum nitride (AlN)-layer nucleation and growth by hydride vapor-phase epitaxy (HVPE) on (100)-oriented single-crystalline silicon substrates. It is established that the substrate pretreatment in (NH4)2S aqueous solution leads to the columnar nucleation of hexagonal AlN crystals of two modifications rotated by 30° relative to each other. Based on the sulfide treatment, a simple method of oxide removal from and preparation of Si(100) substrate surface is developed that can be used for the epitaxial growth of group-III nitride layers.

作者简介

V. Panteleev

Ioffe Physical Technical Institute

Email: bes.triat@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021

M. Shcheglov

Ioffe Physical Technical Institute

Email: bes.triat@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021

V. Bessolov

Ioffe Physical Technical Institute

编辑信件的主要联系方式.
Email: bes.triat@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021

E. Gushchina

Ioffe Physical Technical Institute

Email: bes.triat@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021

E. Konenkova

Ioffe Physical Technical Institute; St. Petersburg National University of Information Technology, Mechanics, and Optics

Email: bes.triat@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021; St. Petersburg, 197101

T. L’vova

Ioffe Physical Technical Institute

Email: bes.triat@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021

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