Hexagonal AlN Layers Grown on Sulfided Si(100) Substrate
- Авторы: Panteleev V.N.1, Shcheglov M.P.1, Bessolov V.N.1, Gushchina E.V.1, Konenkova E.V.1,2, L’vova T.V.1
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Учреждения:
- Ioffe Physical Technical Institute
- St. Petersburg National University of Information Technology, Mechanics, and Optics
- Выпуск: Том 44, № 1 (2018)
- Страницы: 81-83
- Раздел: Regular Papers
- URL: https://bakhtiniada.ru/1063-7850/article/view/207179
- DOI: https://doi.org/10.1134/S106378501801011X
- ID: 207179
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Аннотация
We have studied the influence of sulfide passivation on the initial stages of aluminum nitride (AlN)-layer nucleation and growth by hydride vapor-phase epitaxy (HVPE) on (100)-oriented single-crystalline silicon substrates. It is established that the substrate pretreatment in (NH4)2S aqueous solution leads to the columnar nucleation of hexagonal AlN crystals of two modifications rotated by 30° relative to each other. Based on the sulfide treatment, a simple method of oxide removal from and preparation of Si(100) substrate surface is developed that can be used for the epitaxial growth of group-III nitride layers.
Об авторах
V. Panteleev
Ioffe Physical Technical Institute
Email: bes.triat@mail.ioffe.ru
Россия, St. Petersburg, 194021
M. Shcheglov
Ioffe Physical Technical Institute
Email: bes.triat@mail.ioffe.ru
Россия, St. Petersburg, 194021
V. Bessolov
Ioffe Physical Technical Institute
Автор, ответственный за переписку.
Email: bes.triat@mail.ioffe.ru
Россия, St. Petersburg, 194021
E. Gushchina
Ioffe Physical Technical Institute
Email: bes.triat@mail.ioffe.ru
Россия, St. Petersburg, 194021
E. Konenkova
Ioffe Physical Technical Institute; St. Petersburg National University of Information Technology, Mechanics, and Optics
Email: bes.triat@mail.ioffe.ru
Россия, St. Petersburg, 194021; St. Petersburg, 197101
T. L’vova
Ioffe Physical Technical Institute
Email: bes.triat@mail.ioffe.ru
Россия, St. Petersburg, 194021
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