Deep 3D X-ray Lithography Based on High-Contrast Resist Layers
- Autores: Naz’mov V.P.1
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Afiliações:
- Budker Institute of Nuclear Physics, Siberian Branch, Russian Academy of Sciences
- Edição: Volume 45, Nº 9 (2019)
- Páginas: 906-908
- Seção: Article
- URL: https://bakhtiniada.ru/1063-7850/article/view/208424
- DOI: https://doi.org/10.1134/S1063785019090256
- ID: 208424
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Resumo
In classical X-ray lithography, the mask and resist layer are arranged perpendicular to the incident X-ray beam. Being absorbed in the resist layer, the X-ray beam induces a response in the form corresponding to its cross section. However, using a tilt and rotation of the mask/resist and sequential repeated exposures, it is possible to create three-dimensional forms that are accurate to within less than a micron. New approaches to the creation of 3D microstructures by deep X-ray lithography are described, which can ensure the formation of relatively large arrays.
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Sobre autores
V. Naz’mov
Budker Institute of Nuclear Physics, Siberian Branch, Russian Academy of Sciences
Autor responsável pela correspondência
Email: V.P.Nazmov@inp.nsk.su
Rússia, Novosibirsk, 630090
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