Deep 3D X-ray Lithography Based on High-Contrast Resist Layers


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In classical X-ray lithography, the mask and resist layer are arranged perpendicular to the incident X-ray beam. Being absorbed in the resist layer, the X-ray beam induces a response in the form corresponding to its cross section. However, using a tilt and rotation of the mask/resist and sequential repeated exposures, it is possible to create three-dimensional forms that are accurate to within less than a micron. New approaches to the creation of 3D microstructures by deep X-ray lithography are described, which can ensure the formation of relatively large arrays.

Sobre autores

V. Naz’mov

Budker Institute of Nuclear Physics, Siberian Branch, Russian Academy of Sciences

Autor responsável pela correspondência
Email: V.P.Nazmov@inp.nsk.su
Rússia, Novosibirsk, 630090

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