The Influence of Cavity Design on the Linewidth of Near-IR Single-Mode Vertical-Cavity Surface-Emitting Lasers
- Autores: Blokhin S.A.1, Bobrov M.A.1, Kuz’menkov A.G.1,2, Blokhin A.A.1,2, Vasil’ev A.P.1,2, Guseva Y.A.1,2, Kulagina M.M.1, Zadiranov Y.M.1, Maleev N.A.1,3, Novikov I.I.4, Karachinsky L.Y.1,4, Ledentsov N.N.5, Ustinov V.M.1,2,6
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Afiliações:
- Ioffe Physical Technical Institute
- Submicron Heterostructures for Microelectronics Research and Engineering Center
- St. Petersburg State Electrotechnical University
- Connector Optics LLC
- VI Systems GmbH
- Peter the Great St. Petersburg Polytechnic University
- Edição: Volume 44, Nº 1 (2018)
- Páginas: 28-31
- Seção: Near-IR Vertical-Cavity Surface-Emitting Lasers (Special Issue)
- URL: https://bakhtiniada.ru/1063-7850/article/view/207087
- DOI: https://doi.org/10.1134/S1063785018010042
- ID: 207087
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Resumo
The studies of the emission linewidth for single-mode near-IR vertical-cavity surface-emitting lasers with an active region based on InGaAs/AlGaAs quantum wells and different optical microcavity design. For low mirror loss, lasers with a 1λ cavity and carrier injection through distributed Bragg reflectors demonstrate a linewidth of 70 MHz and its growth to 110 MHz with increasing mirror loss (corresponding differential of efficiency ∼0.65 W/A). The design of the optical cavity with carrier injection through intracavity contacts and low-Q composition Bragg lattices reduces the linewidth to 40 MHz in spite of high mirror loss (corresponding differential efficiency of ∼0.6 W/A).
Sobre autores
S. Blokhin
Ioffe Physical Technical Institute
Autor responsável pela correspondência
Email: blokh@mail.ioffe.ru
Rússia, St. Petersburg, 194021
M. Bobrov
Ioffe Physical Technical Institute
Email: blokh@mail.ioffe.ru
Rússia, St. Petersburg, 194021
A. Kuz’menkov
Ioffe Physical Technical Institute; Submicron Heterostructures for Microelectronics Research and Engineering Center
Email: blokh@mail.ioffe.ru
Rússia, St. Petersburg, 194021; St. Petersburg, 194021
A. Blokhin
Ioffe Physical Technical Institute; Submicron Heterostructures for Microelectronics Research and Engineering Center
Email: blokh@mail.ioffe.ru
Rússia, St. Petersburg, 194021; St. Petersburg, 194021
A. Vasil’ev
Ioffe Physical Technical Institute; Submicron Heterostructures for Microelectronics Research and Engineering Center
Email: blokh@mail.ioffe.ru
Rússia, St. Petersburg, 194021; St. Petersburg, 194021
Yu. Guseva
Ioffe Physical Technical Institute; Submicron Heterostructures for Microelectronics Research and Engineering Center
Email: blokh@mail.ioffe.ru
Rússia, St. Petersburg, 194021; St. Petersburg, 194021
M. Kulagina
Ioffe Physical Technical Institute
Email: blokh@mail.ioffe.ru
Rússia, St. Petersburg, 194021
Yu. Zadiranov
Ioffe Physical Technical Institute
Email: blokh@mail.ioffe.ru
Rússia, St. Petersburg, 194021
N. Maleev
Ioffe Physical Technical Institute; St. Petersburg State Electrotechnical University
Email: blokh@mail.ioffe.ru
Rússia, St. Petersburg, 194021; St. Petersburg, 197022
I. Novikov
Connector Optics LLC
Email: blokh@mail.ioffe.ru
Rússia, St. Petersburg, 194292
L. Karachinsky
Ioffe Physical Technical Institute; Connector Optics LLC
Email: blokh@mail.ioffe.ru
Rússia, St. Petersburg, 194021; St. Petersburg, 194292
N. Ledentsov
VI Systems GmbH
Email: blokh@mail.ioffe.ru
Alemanha, Berlin
V. Ustinov
Ioffe Physical Technical Institute; Submicron Heterostructures for Microelectronics Research and Engineering Center; Peter the Great St. Petersburg Polytechnic University
Email: blokh@mail.ioffe.ru
Rússia, St. Petersburg, 194021; St. Petersburg, 194021; St. Petersburg, 195251
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