The Influence of Cavity Design on the Linewidth of Near-IR Single-Mode Vertical-Cavity Surface-Emitting Lasers
- Authors: Blokhin S.A.1, Bobrov M.A.1, Kuz’menkov A.G.1,2, Blokhin A.A.1,2, Vasil’ev A.P.1,2, Guseva Y.A.1,2, Kulagina M.M.1, Zadiranov Y.M.1, Maleev N.A.1,3, Novikov I.I.4, Karachinsky L.Y.1,4, Ledentsov N.N.5, Ustinov V.M.1,2,6
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Affiliations:
- Ioffe Physical Technical Institute
- Submicron Heterostructures for Microelectronics Research and Engineering Center
- St. Petersburg State Electrotechnical University
- Connector Optics LLC
- VI Systems GmbH
- Peter the Great St. Petersburg Polytechnic University
- Issue: Vol 44, No 1 (2018)
- Pages: 28-31
- Section: Near-IR Vertical-Cavity Surface-Emitting Lasers (Special Issue)
- URL: https://bakhtiniada.ru/1063-7850/article/view/207087
- DOI: https://doi.org/10.1134/S1063785018010042
- ID: 207087
Cite item
Abstract
The studies of the emission linewidth for single-mode near-IR vertical-cavity surface-emitting lasers with an active region based on InGaAs/AlGaAs quantum wells and different optical microcavity design. For low mirror loss, lasers with a 1λ cavity and carrier injection through distributed Bragg reflectors demonstrate a linewidth of 70 MHz and its growth to 110 MHz with increasing mirror loss (corresponding differential of efficiency ∼0.65 W/A). The design of the optical cavity with carrier injection through intracavity contacts and low-Q composition Bragg lattices reduces the linewidth to 40 MHz in spite of high mirror loss (corresponding differential efficiency of ∼0.6 W/A).
About the authors
S. A. Blokhin
Ioffe Physical Technical Institute
Author for correspondence.
Email: blokh@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021
M. A. Bobrov
Ioffe Physical Technical Institute
Email: blokh@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021
A. G. Kuz’menkov
Ioffe Physical Technical Institute; Submicron Heterostructures for Microelectronics Research and Engineering Center
Email: blokh@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021; St. Petersburg, 194021
A. A. Blokhin
Ioffe Physical Technical Institute; Submicron Heterostructures for Microelectronics Research and Engineering Center
Email: blokh@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021; St. Petersburg, 194021
A. P. Vasil’ev
Ioffe Physical Technical Institute; Submicron Heterostructures for Microelectronics Research and Engineering Center
Email: blokh@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021; St. Petersburg, 194021
Yu. A. Guseva
Ioffe Physical Technical Institute; Submicron Heterostructures for Microelectronics Research and Engineering Center
Email: blokh@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021; St. Petersburg, 194021
M. M. Kulagina
Ioffe Physical Technical Institute
Email: blokh@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021
Yu. M. Zadiranov
Ioffe Physical Technical Institute
Email: blokh@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021
N. A. Maleev
Ioffe Physical Technical Institute; St. Petersburg State Electrotechnical University
Email: blokh@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021; St. Petersburg, 197022
I. I. Novikov
Connector Optics LLC
Email: blokh@mail.ioffe.ru
Russian Federation, St. Petersburg, 194292
L. Ya. Karachinsky
Ioffe Physical Technical Institute; Connector Optics LLC
Email: blokh@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021; St. Petersburg, 194292
N. N. Ledentsov
VI Systems GmbH
Email: blokh@mail.ioffe.ru
Germany, Berlin
V. M. Ustinov
Ioffe Physical Technical Institute; Submicron Heterostructures for Microelectronics Research and Engineering Center; Peter the Great St. Petersburg Polytechnic University
Email: blokh@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021; St. Petersburg, 194021; St. Petersburg, 195251
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