A holographic method of the quantitative measurement of photolithographic replicas of thick raised surface defects

详细

To solve the problem of the evaluation of the characteristic sizes and patterns of surface microdefects of complex-shaped samples, a holographic method for the measurement of transparent replicas representing an inverse impression of the investigated surface is proposed. This measurement method is based on the digital registration of the interferograms of a polymeric replica in the modified off-axis Leith–Upatnieks holographic scheme and on the calculation of the phase-incursion difference from a series of reconstructed digital holograms.