Determination of the shape of indenters for nanohardness testers via interferometry


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Аннотация

A method for determination of the contact-area functions for diamond indenters of nanohardness testers using a metrological atomic-force microscope with three-coordinate laser interferometer is proposed. Face shapes of a number of indenters of Berkovich pyramid type are measured. The precision of the indenter surface coordinates measurement is 1 nm. It is demonstrated that the indenter tip shape changes in the course of its use; in particular, for the first 100 nm the deviation from the ideal pyramid can exceed 30 nm. Thus, one of the methods for verification of the contact-area function for an indenter is its periodic calibration using a metrological atomic-force microscope.

Авторлар туралы

T. Kazieva

National Research Nuclear University MEPhI

Хат алмасуға жауапты Автор.
Email: glizerogen@gmail.com
Ресей, Moscow, 115409

A. Kuznetsov

National Research Nuclear University MEPhI

Email: glizerogen@gmail.com
Ресей, Moscow, 115409

K. Gubskii

National Research Nuclear University MEPhI

Email: glizerogen@gmail.com
Ресей, Moscow, 115409

M. Ponarina

National Research Nuclear University MEPhI

Email: glizerogen@gmail.com
Ресей, Moscow, 115409

V. Reshetov

Technological Institute for Superhard and Novel Carbon Materials

Email: glizerogen@gmail.com
Ресей, Troitsk, Moscow, 142190

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