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Photoluminescence at the fundamental absorption edge of single-crystal silicon textured without masking


Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

The extraction efficiencies of edge luminescence from single-crystal silicon have been compared for three structures: textured without masking, untextured, and textured with masking by the technology of high-efficiency solar cells. The highest efficiency was obtained for the structure textured without masking. For this structure, the efficiency of power conversion at a wavelength of ~0.66 μm and power of 75 mW into edge PL power emerging from the semiconductor was η ≈ 0.8% under the nonradiative recombination conditions described by the exponential photoluminescence (PL) decay time constant of ~0.11 ms. The directivity diagrams of the edge PL were measured for the three structures under study.

Авторлар туралы

A. Emel’yanov

Ioffe Physical-Technical Institute

Хат алмасуға жауапты Автор.
Email: Emelyanov@mail.ioffe.ru
Ресей, St. Petersburg, 194021

S. Abolmasov

R&D Center for Thin-Film Technologies in Energetics

Email: Emelyanov@mail.ioffe.ru
Ресей, St. Petersburg, 194064

E. Terukov

Ioffe Physical-Technical Institute; R&D Center for Thin-Film Technologies in Energetics

Email: Emelyanov@mail.ioffe.ru
Ресей, St. Petersburg, 194021; St. Petersburg, 194064

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