Ferroelectric films of barium strontium titanate on semi-insulating silicon carbide substrates


Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

Thin ferroelectric BaxSr1–xTiO3 (BST) layers have been grown for the first time on semi-insulating silicon carbide substrates by RF magnetron sputtering of a ceramic target without using buffer sublayers. Results of investigation of the structure of obtained BST films and the electrical properties of related planar capacitors are presented. The obtained structures are characterized by high nonlinearity and low dielectric losses at microwave frequencies.

Авторлар туралы

A. Tumarkin

St. Petersburg State Electrotechnical University (LETI)

Хат алмасуға жауапты Автор.
Email: avtumarkin@yandex.ru
Ресей, St. Petersburg, 197376

S. Razumov

St. Petersburg State Electrotechnical University (LETI)

Email: avtumarkin@yandex.ru
Ресей, St. Petersburg, 197376

A. Gagarin

St. Petersburg State Electrotechnical University (LETI)

Email: avtumarkin@yandex.ru
Ресей, St. Petersburg, 197376

A. Odinets

St. Petersburg State Electrotechnical University (LETI)

Email: avtumarkin@yandex.ru
Ресей, St. Petersburg, 197376

A. Mikhailov

St. Petersburg State Electrotechnical University (LETI); Dagestan State University

Email: avtumarkin@yandex.ru
Ресей, St. Petersburg, 197376; Makhachkala, Dagestan, 367000

I. Pronin

Ioffe Physical Technical Institute

Email: avtumarkin@yandex.ru
Ресей, St. Petersburg, 194021

V. Stozharov

Herzen State Pedagogical University of Russia

Email: avtumarkin@yandex.ru
Ресей, St. Petersburg, 191186

S. Senkevich

Ioffe Physical Technical Institute

Email: avtumarkin@yandex.ru
Ресей, St. Petersburg, 194021

N. Travin

Svetlana–Electronpribor Corporation

Email: avtumarkin@yandex.ru
Ресей, St. Petersburg, 194156

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