Author Details

Drozdov, M. N.

Issue	Section	Title	File
Vol 42, No 3 (2016)	Article	Nonlinear calibration curves in secondary ion mass spectrometry for quantitative analysis of gesi heterostructures with nanoclusters
Vol 42, No 8 (2016)	Article	Extremely deep profiling analysis of the atomic composition of thick (>100 μm) GaAs layers within power PIN diodes by secondary ion mass spectrometry
Vol 43, No 5 (2017)	Article	Selective analysis of the elemental composition of InGaAs/GaAs nanoclusters by secondary ion mass spectrometry
Vol 44, No 4 (2018)	Article	New Cluster Secondary Ions for Quantitative Analysis of the Concentration of Boron Atoms in Diamond by Time-of-Flight Secondary-Ion Mass Spectrometry
Vol 44, No 4 (2018)	Article	A New Limitation of the Depth Resolution in TOF-SIMS Elemental Profiling: the Influence of a Probing Ion Beam
Vol 45, No 1 (2019)	Article	Experimental Observation of the Confinement of Atomic Collision Cascades during Ion Sputtering of Porous Silicon
Vol 45, No 1 (2019)	Article	A New Approach to TOF-SIMS Analysis of the Phase Composition of Carbon-Containing Materials