The defect mode in a low-dimensional waveguide microwave photonic crystal

Abstract

It is shown that the violation of periodicity in a low-dimensional waveguide microwave photonic crystal, in which the periodic structure is formed by dielectric layers and adjacent metal plates partly overlapping the waveguide cross section and forming capacitive gaps between the plate edge and wide wall of the waveguide, leads to the appearance of a defect (impurity) mode. It is established that the defect mode position on the frequency scale significantly depends on both the thickness of “disturbed” dielectric layer and the capacitive gap width of diaphragms.