Мақаланы E-mail арқылы жіберу Simulation of Properties of Images with Atomic Resolution in a Scanning Probe Microscope
- Авторлар: Potapov A.A.1,2,3, Rekhviashvili S.S.4
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Мекемелер:
- Kotel’nikov Institute of Radio Engineering and Electronics
- JiNan University (JNU)
- Cooperative Chinese-Russian Laboratory of Informational Technologies and Signals Fractal Processing of JNU-IREE RAS
- Institute of Applied Mathematics and Automatization, Kabardino-Balkar Scientific Center
- Шығарылым: Том 63, № 6 (2018)
- Беттер: 777-781
- Бөлім: Theoretical and Mathematical Physics
- URL: https://bakhtiniada.ru/1063-7842/article/view/201445
- DOI: https://doi.org/10.1134/S1063784218060166
- ID: 201445
Дәйексөз келтіру
Ашық рұқсат
Рұқсат берілді
Тек жазылушылар үшін
Аннотация
A method for simulation of images in a scanning probe microscope (SPM) using simultaneous wavelet transform and median filtering is proposed. The wavelet transform with the fourth-order Daubechies kernel is used. Such a transform makes it possible to select details of different scales in the SPM image and, hence, study fractal properties of surfaces. Simulation is used to show that ultrahigh (atomic) resolution is possible in SPM provided that the size of the contact region in the probe–sample system is significantly greater than atomic size and the lattice atoms are randomly distributed. Contrast inversion in the SPM images in the multiscan mode is interpreted.
Авторлар туралы
A. Potapov
Kotel’nikov Institute of Radio Engineering and Electronics; JiNan University (JNU); Cooperative Chinese-Russian Laboratory of Informational Technologies and Signals Fractal Processing of JNU-IREE RAS
Email: rsergo@mail.ru
Ресей, Moscow, 125009; Guangzhou; Guangzhou
S. Rekhviashvili
Institute of Applied Mathematics and Automatization, Kabardino-Balkar Scientific Center
Хат алмасуға жауапты Автор.
Email: rsergo@mail.ru
Ресей, Nalchik, 360000
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