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Investigation of a Contamination Film Formed by the Electron Beam Irradiation


Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

In the study of materials on electron probe devices in the field of action of the electron beam, a contaminating hydrocarbon film is formed, which affects the experimental results. In this paper, we have studied the influence of a contamination film on carbon-film-coated dielectrics on the intensity of cathodoluminescence and characteristic X-ray lines. The absorption coefficient of the contamination film in the visible and UV ranges has been determined. Filming mechanisms at different parameters of the electron beam have been discussed.

Авторлар туралы

K. Orekhova

Ioffe Institute, Russian Academy of Sciences

Хат алмасуға жауапты Автор.
Email: orekhova.kseniia@gmail.com
Ресей, St. Petersburg, 194021

Yu. Serov

Ioffe Institute, Russian Academy of Sciences

Email: orekhova.kseniia@gmail.com
Ресей, St. Petersburg, 194021

P. Dement’ev

Ioffe Institute, Russian Academy of Sciences

Email: orekhova.kseniia@gmail.com
Ресей, St. Petersburg, 194021

E. Ivanova

Ioffe Institute, Russian Academy of Sciences

Email: orekhova.kseniia@gmail.com
Ресей, St. Petersburg, 194021

V. Kravets

Ioffe Institute, Russian Academy of Sciences

Email: orekhova.kseniia@gmail.com
Ресей, St. Petersburg, 194021

V. Usacheva

Ioffe Institute, Russian Academy of Sciences

Email: orekhova.kseniia@gmail.com
Ресей, St. Petersburg, 194021

M. Zamoryanskaya

Ioffe Institute, Russian Academy of Sciences

Email: orekhova.kseniia@gmail.com
Ресей, St. Petersburg, 194021

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