Texturing in a Ni–W/TiN Thin-Film System

Abstract

Double-layer thin-film compositions with a TiN coating based on a ferromagnetic Ni–5 at % W alloy and a paramagnetic Ni–9.5 at % W alloy have been prepared. Texturing in both components of the Ni–W/TiN system has been studied using X-ray diffraction analysis. It has been found that the coating layer causes crystal planes in the Ni–9.5 at % W strip to reorient and thereby enhances the cube texture in the substrate. It has been shown that under certain growth conditions, a thin TiN coating above the Ni–9.5 at % W/TiN substrate grows quasi-single-crystalline with a cube texture.