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Defect Mode in Microwave Waveguide Bragg Structures with Metal Pins


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Abstract

A waveguide Bragg structure containing equidistant cylindrical pins that are galvanically coupled to a wide wall of the waveguide is used to implement frequency response functions characterized by the presence of a band gap. Characteristics of a defect mode of the microwave photonic crystal with a pin element as a defect with an nipin structure with controlled conductivity placed in the capacitive gap are experimentally studied and calculated. Controlled reflectance of a microwave signal with a dynamic range of greater than 50 dB is obtained at the frequency of the defect mode.

About the authors

D. A. Usanov

Chernyshevsky State University

Email: skripala_v@info.sgu.ru
Russian Federation, Saratov, 410012

A. V. Skripal’

Chernyshevsky State University

Author for correspondence.
Email: skripala_v@info.sgu.ru
Russian Federation, Saratov, 410012

V. N. Posadskii

Chernyshevsky State University

Email: skripala_v@info.sgu.ru
Russian Federation, Saratov, 410012

V. S. Tyazhlov

Chernyshevsky State University

Email: skripala_v@info.sgu.ru
Russian Federation, Saratov, 410012

A. V. Baikin

Chernyshevsky State University

Email: skripala_v@info.sgu.ru
Russian Federation, Saratov, 410012

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