Spectral ellipsometry as a method for characterization of nanosized films with ferromagnetic layers
- Авторлар: Hashim H.1, Singkh S.P.1, Panina L.V.1,2, Pudonin F.A.3, Sherstnev I.A.3, Podgornaya S.V.1, Shpetnyi I.A.4, Beklemisheva A.V.1
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Мекемелер:
- National Research Technological University “MISiS,”
- Institute of Design Problems in Microelectronics
- Lebedev Physical Institute
- Sumy State University
- Шығарылым: Том 59, № 11 (2017)
- Беттер: 2211-2215
- Бөлім: Magnetism
- URL: https://bakhtiniada.ru/1063-7834/article/view/201518
- DOI: https://doi.org/10.1134/S1063783417110142
- ID: 201518
Дәйексөз келтіру
Аннотация
Nanosized films with ferromagnetic layers are widely used in nanoelectronics, sensor systems and telecommunications. Their properties may strongly differ from those of bulk materials that is on account of interfaces, intermediate layers and diffusion. In the present work, spectral ellipsometry and magnetooptical methods are adapted for characterization of the optical parameters and magnetization processes in two- and three-layer Cr/NiFe, Al/NiFe and Сr(Al)/Ge/NiFe films onto a sitall substrate for various thicknesses of Cr and Al layers. At a layer thickness below 20 nm, the complex refractive coefficients depend pronouncedly on the thickness. In two-layer films, remagnetization changes weakly over a thickness of the top layer, but the coercive force in three-layer films increases by more than twice upon remagnetization, while increasing the top layer thickness from 4 to 20 nm.
Авторлар туралы
H. Hashim
National Research Technological University “MISiS,”
Хат алмасуға жауапты Автор.
Email: hh@science.tanta.edu.eg
Ресей, Moscow
S. Singkh
National Research Technological University “MISiS,”
Email: hh@science.tanta.edu.eg
Ресей, Moscow
L. Panina
National Research Technological University “MISiS,”; Institute of Design Problems in Microelectronics
Email: hh@science.tanta.edu.eg
Ресей, Moscow; Moscow
F. Pudonin
Lebedev Physical Institute
Email: hh@science.tanta.edu.eg
Ресей, Moscow
I. Sherstnev
Lebedev Physical Institute
Email: hh@science.tanta.edu.eg
Ресей, Moscow
S. Podgornaya
National Research Technological University “MISiS,”
Email: hh@science.tanta.edu.eg
Ресей, Moscow
I. Shpetnyi
Sumy State University
Email: hh@science.tanta.edu.eg
Украина, Sumy
A. Beklemisheva
National Research Technological University “MISiS,”
Email: hh@science.tanta.edu.eg
Ресей, Moscow
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